X-Ray Powder Diffraction

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  • Published date: March 11, 2019
    • Shirley, New York, United States

X-ray powder diffraction (XRPD) is a commonly accepted analytical technique, which can help researchers to understand the forms and states of an active pharmaceutical ingredients. For the analysis of XRD patterns, the key for researchers to pay attention to is to measure diffraction patterns and analyze them correctly. When a single X-ray irradiates a single crystal, many "spots" are produced. The position of the point is determined by the size and shape of the unit and the symmetry. The intensity of the spot is determined by the arrangement of the atoms in the crystal. After measuring the intensity of all diffraction spots (reflections), the position of atoms in the unit lattice (structure) can usually be determined directly. However, if the sample is very complex, such as diffuse scattering or non-periodic structures, structural analysis is a challenge even for the most skilled analysts.

BOC Sciences has collaborated with academic and industrial users to develop a series of X-ray diffractometers that provide the most advanced, versatile and cost-effective diffraction solutions. Our scientists and technicians encompassing Ph.D.'s in crystal chemistry, analytical chemistry and other diverse technical fields, have more than 10 years of combined experience. We are dedicated to materials research, solid-state physics and chemistry development, advanced material development, biological active systems, drugs and nano-functional materials included.


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