Imaging

Listings
  • High Quality Long-Lever-Tapping Mode/Non-Contact Mode-Etched Silicon Wafer Probes

    High Quality Long-Lever-Tapping Mode/Non-Contact Mode-Etched Silicon Wafer Probes

    Imaging Shirley (New York) February 2, 2021 Check with publisher

    A wafer of High quality long-lever etched silicon probes for Tapping Mode and other non-contact modes. Unmounted for use on standard AFM's. AFM Nanoprobes's new line of high quality premiumetched silicon probes set the industry standard for long-leve...

  • AFMN-Value Line Etched Silicon Probes-Al-10

    AFMN-Value Line Etched Silicon Probes-Al-10

    Imaging Shirley (New York) February 2, 2021 Check with publisher

    A pack of Silicon Probes. Quantity=10 AFM Nanoprobes's Value Line etched silicon probes for imaging in Tapping Mode and non-contact mode in air, with reflective coating. This probe is also available without Aluminum reflex coating.Specifications:- 40...

  • Visible Apex Tip-2

    Visible Apex Tip-2

    Imaging Shirley (New York) February 2, 2021 Check with publisher

    Outstanding features of the visible apex tip:1) Easily access where you want to see:The visible apex tip is located on the very end of the cantilever. This allowsyou to set the tip over a point of interest on the sample, easily andprecisely, especial...

  • High Quality-Soft Tapping/Other Non-contact Modes-Etched Silicon Wafer Probes-3

    High Quality-Soft Tapping/Other Non-contact Modes-Etched Silicon Wafer Probes-3

    Imaging Shirley (New York) February 2, 2021 Check with publisher

    A wafer of High quality etched silicon probes for soft Tapping Mode and other non-contact modes. Unmounted for use on standard AFM's. AFM Nanoprobes's probes are the preferred choice for high-sensitivity silicon probe imaging in Tapping Mode or non-c...

  • High Aspect Ratio-Repeatable-PeakForce Tapping Probe-350

    High Aspect Ratio-Repeatable-PeakForce Tapping Probe-350

    Imaging Shirley (New York) February 2, 2021 Check with publisher

    High aspect ratio probe for repeatable, accurate depth metrology and imaging on challenging structures such as deep trenches and pits, as encountered on semiconductor samples and optics.350nm tall spike with 10nm end radius and 30nm base width https:...

  • High Quality-Tapping/Other Non-contact Modes-Etched Silicon Wafer Probes-2

    High Quality-Tapping/Other Non-contact Modes-Etched Silicon Wafer Probes-2

    Imaging Shirley (New York) February 2, 2021 Check with publisher

    A wafer of High quality etched silicon probes for Tapping Mode and other non-contact modes. Unmounted for use on standard AFM's. AFM Nanoprobes's probes are the preferred choice for high-sensitivity silicon probe imaging in Tapping Mode or non-contac...

  • Top Visual-Precise Positioning-AFM Probes-a/ Al

    Top Visual-Precise Positioning-AFM Probes-a/ Al

    Imaging Shirley (New York) February 2, 2021 Check with publisher

    AFM Nanoprobes's Top Visual series probes allow the user precise control over positioning of the tip over a specific point of interest in the sample. This allows for direct, real-time observation of the sample scanning and modification process. Our T...

  • Cantilevers with Micron Spheres-Tipless Probes-c-Au

    Cantilevers with Micron Spheres-Tipless Probes-c-Au

    Imaging Shirley (New York) February 2, 2021 Check with publisher

    Colloidal Probe Atomic Force Microscopy requires a tip of known shape to be mounted cleanly on a consistently reproducible cantilever. These probes are known as "Colloidal Probes" and are used to study colloidal interactions between two surfaces and ...

  • High Resolution Imaging-Fluid-Sharpened Tip

    High Resolution Imaging-Fluid-Sharpened Tip

    Imaging Shirley (New York) February 2, 2021 Check with publisher

    The probes have a sharpened tip ideal for high-resolution imaging in fluid. Proprietary method for curve collection and sophisticated algorithms to continuously monitor image quality, and to automatically make appropriate parameter adjustments. All p...

  • High Quality-Soft Tapping Mode/Force Modulation-Etched Silicon Probes-Al-2

    High Quality-Soft Tapping Mode/Force Modulation-Etched Silicon Probes-Al-2

    Imaging Shirley (New York) February 2, 2021 Check with publisher

    AFM Nanoprobes's probes are the preferred choice for high-sensitivity silicon probe imaging in Tapping Mode or non-contact mode in air. Every aspect of the probes design has been optimized to provide the most accurate profiling of microscopic feature...

  • High Quality-Soft Tapping Mode/Force Modulation-Etched Silicon Wafer Probes-3

    High Quality-Soft Tapping Mode/Force Modulation-Etched Silicon Wafer Probes-3

    Imaging Shirley (New York) February 2, 2021 Check with publisher

    Every aspect of the probes design has been optimized to provide the most accurate profiling of microscopic features. With precisely controlled cantilever geometry to enable repeatable scanning parameters, an extra sharp tip radius to reduce the AFM's...

  • AFM-NP Dimension FastScan Probe-c

    AFM-NP Dimension FastScan Probe-c

    Imaging Shirley (New York) February 2, 2021 Check with publisher

    AFM-NP Dimension FastScan AFM Probe-c are designed specifically for imaging in fluid on the Dimension FastScan AFM. They deliver extreme imaging speed without loss of resolution, loss of force control, or added complexity. With the ability to perform...